An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation.

Tony Tae-Hyoung Kim Wei Zhang Chris H. Kim

Published in: CICC (2009)

Keyphrases

fully automated
fully automatic
semi automated
statistical tests
statistical significance
manual segmentation
labor intensive
statistical analysis
power consumption
low power
completely automated
data transmission
input image
high speed
statistically significant
post hoc