Wanli Jiang

Publication Activity (10 Years)

Years Active: 1998-2024
Publications (10 Years): 7

Top Topics

Object Detectors

Top Venues

Int. J. Grid Util. Comput.

Publications

Trung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi, Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park
NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving. WACV (2024)
Trung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park
NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving. CoRR (2023)
Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors. CVPR (2022)
Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon, Siyi Li
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors. CoRR (2021)
Aomei Li, Wanli Jiang, Po Ma, Jiahui Guo, Weihua Yuan, Dehui Dai
A real-time matching algorithm using sparse matrix. Int. J. Grid Util. Comput. 11 (1) (2020)
Zhaoxuan Fan, Tianwei Lin, Xu Zhao, Wanli Jiang, Tao Xu, Ming Yang
An Online Approach for Gesture Recognition Toward Real-World Applications. ICIG (1) (2017)
Wanli Jiang, Duan Feng, Dehui Xu, Bin Xiong, Yuelin Wang, Wanli Jiang, Duan Feng
Silicon cavity resonator based on locally resonant phononic crystal. IEEE SENSORS (2016)
Wanli Jiang, Eric Peterson, Bob Robotka
Effectiveness Improvement of ECR Tests. ITC (2003)
Wanli Jiang, Eric Peterson
Performance Comparison of VLV, ULV, and ECR Tests. J. Electron. Test. 19 (2) (2003)
Wanli Jiang, Eric Peterson
Performance Comparison of VLV, ULV, and ECR Tests. VTS (2002)
Wanli Jiang, Bapiraju Vinnakota
test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (6) (2002)
Wanli Jiang, Bapiraju Vinnakota
Defect-oriented test scheduling. IEEE Trans. Very Large Scale Integr. Syst. 9 (3) (2001)
Eric Peterson, Wanli Jiang
Practical application of energy consumption ratio test. ITC (2001)
Wanli Jiang, Bapiraju Vinnakota
IC test using the energy consumption ratio. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (1) (2000)
Wanli Jiang, Bapiraju Vinnakota
Defect-Oriented Test Scheduling. VTS (1999)
Wanli Jiang, Bapiraju Vinnakota
Statistical threshold formulation for dynamic I_dd test. ITC (1999)
Wanli Jiang, Bapiraju Vinnakota
IC Test Using the Energy Consumption Ratio. DAC (1999)
Dechang Sun, Bapiraju Vinnakota, Wanli Jiang
Fast State Verification. DAC (1998)
Bapiraju Vinnakota, Wanli Jiang, Dechang Sun
Process-tolerant test with energy consumption ratio. ITC (1998)