Vincent O'Brien

Publication Activity (10 Years)

Years Active: 2009-2022
Publications (10 Years): 11

Top Topics

Image Classification

Top Venues

IEEE Open J. Circuits Syst.

Circuits Syst. Signal Process.

Publications

Emma Lhermitte, Mirvana Hilal, Ryan Furlong, Vincent O'Brien, Anne Humeau-Heurtier
Deep Learning and Entropy-Based Texture Features for Color Image Classification. Entropy 24 (11) (2022)
Shantanu Mehta, Roberto Pelliconi, Christophe Erdmann, Vincent O'Brien, Brendan Mullane
Comparison of High-Order Programmable Mismatch Shaping Bandpass DEM Implementations Applicable to Nyquist-Rate D/A Converters. IEEE Open J. Circuits Syst. 2 (2021)
Ryan Furlong, Mirvana Hilal, Vincent O'Brien, Anne Humeau-Heurtier
Parameter Analysis of Multiscale Two-Dimensional Fuzzy and Dispersion Entropy Measures Using Machine Learning Classification. Entropy 23 (10) (2021)
Shantanu Mehta, Brendan Mullane, Vincent O'Brien, Roberto Pelliconi, Christophe Erdmann
A Higher-Order Programmable Amplitude and Timing Error Shaping Bandpass DEM for Nyquist-Rate D/A Converters. ISCAS (2021)
Ryan Furlong, Vincent O'Brien, James Garland, Francisco Domínguez-Mateos
Metric Embedding Sub-discrimination Study. CoRR (2021)
Shantanu Mehta, Daniel O'Hare, Vincent O'Brien, Eric Thompson, Brendan Mullane
Analysis and Design of a Tri-Level Current-Steering DAC With 12-Bit Linearity and Improved Impedance Matching Suitable for CT-ADCs. IEEE Open J. Circuits Syst. 1 (2020)
Shantanu Mehta, Brendan Mullane, Vincent O'Brien, Roberto Pelliconi, Christophe Erdmann
A Wideband 6th Order Programmable Bandpass DEM Implementation for a Nyquist DAC. ICECS (2020)
Vincent O'Brien, Brendan Mullane
High Order Mismatch Shaping for Low Oversampling Rates. IEEE Trans. Circuits Syst. II Express Briefs (1) (2020)
Brendan Mullane, Vincent O'Brien
An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test. MWSCAS (2018)
Vincent O'Brien, Anthony G. Scanlan, Brendan Mullane
A Reduced Hardware ISI and Mismatch Shaping DEM Decoder. Circuits Syst. Signal Process. 37 (6) (2018)
Vincent O'Brien, Anthony G. Scanlan, Brendan Mullane
Correction to: A Reduced Hardware ISI and Mismatch Shaping DEM Decoder. Circuits Syst. Signal Process. 37 (6) (2018)
Hongjia Mo, Michael Peter Kennedy, Vincent O'Brien, Brendan Mullane
Experimental validation of DAC with nested bus-splitting EFM4 DDSM. ECCTD (2013)
Brendan Mullane, Vincent O'Brien
A 100dB SFDR 0.5V pk-pk Band-Pass DAC Implemented on a Low Voltage CMOS Process. VLSI-SoC (Selected Papers) (2011)
Brendan Mullane, Vincent O'Brien
A high performance band-pass DAC architecture and design targeting a low voltage silicon process. VLSI-SoC (2011)
Vincent O'Brien, Brendan Mullane
High order mismatch noise shaping for bandpass DACs. ICECS (2011)
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
An SOC platform for ADC test and measurement. DDECS (2009)
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
A prototype platform for system-on-chip ADC test and measurement. SoCC (2009)
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. ITC (2009)
Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann
An on-chip solution for static ADC test and measurement. ACM Great Lakes Symposium on VLSI (2009)