Vincent Goiffon

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 11

Top Topics

Leakage Current

Image Processing Algorithms

Top Venues

IEEE Geosci. Remote. Sens. Lett.

Imaging Sensors and Systems

Publications

Stefano Merzi, Fabio Acerbi, Corinne Aicardi, Daniela Fiore, Vincent Goiffon, Alberto Giacomo Gola, Olivier Marcelot, Alex Materne, Olivier Saint-Pé
Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations. Sensors 24 (15) (2024)
M. Gouveia da Cunha, Sébastien Place, O. Gauthier, N. Virollet, M. Vignetti, Philippe Martin-Gonthier, Pierre Magnan, Vincent Goiffon
Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors. IRPS (2024)
Clémentine Durnez, Cédric Virmontois, Pierre Panuel, Aubin Antonsanti, Vincent Goiffon, Magali Estribeau, Olivier Saint-Pé, Valérian Lalucaa, Erick Berdin, Franck Larnaudie, Jean-Marc Belloir, Catalin Codreanu, Ludovic Chavanne
Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications. Sensors 23 (13) (2023)
Nour Fassi, Jean-Pierre Carrère, Pierre Magnan, Magali Estribeau, Vincent Goiffon
Quantum efficiency of backside-illuminated pixels under ultraviolet illumination: ARC coatings impact measurements and simulations. Imaging Sensors and Systems (2023)
Olivier Marcelot, Marjorie Morvan, Antoine Salih Alj, Stephane Demiguel, Cédric Virmontois, Anne Rouvié, Magali Estribeau, Vincent Goiffon
Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging. Sensors 23 (23) (2023)
Sylvain Lucas, Thomas Oberlin, Vincent Goiffon, Fanny Le Mer
Automatic Detection and Correction of Random Telegraph Signal Artifacts in Earth Observation Images. IEEE Geosci. Remote. Sens. Lett. 19 (2022)
Yolène Sacchettini, Jean-Pierre Carrère, Romain Duru, Jean-Pierre Oddou, Vincent Goiffon, Pierre Magnan
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current. Sensors 19 (24) (2019)
Alexandre Le Roch, Vincent Goiffon, Olivier Marcelot, Philippe Paillet, Federico Pace, Jean-Marc Belloir, Pierre Magnan, Cédric Virmontois
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors 19 (24) (2019)
Yolène Sacchettini, Jean-Pierre Carrère, Vincent Goiffon, Pierre Magnan
Plasma Antenna Charging in CMOS Image Sensors. IRPS (2019)
Calvin Yi-Ping Chao, Shang-Fu Yeh, Meng-Hsu Wu, Kuo-Yu Chou, Honyih Tu, Chih-Lin Lee, Chin Yin, Philippe Paillet, Vincent Goiffon
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. Sensors 19 (24) (2019)
Dan McGrath, Steve Tobin, Vincent Goiffon, Pierre Magnan, Alexandre Le Roch
Dark Current Limiting Mechanisms in CMOS Image Sensors. IMSE (2018)
Alice Pelamatti, Vincent Goiffon, Aziouz Chabane, Pierre Magnan, Cédric Virmontois, Olivier Saint-Pé, Michel Breart de Boisanger
Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method. ESSDERC (2015)