Login / Signup
Philippe Paillet
ORCID
Publication Activity (10 Years)
Years Active: 2017-2022
Publications (10 Years): 6
Top Topics
Computer Tomography
Low Dose
Leakage Current
Cmos Image Sensor
Top Venues
Sensors
Microelectron. Reliab.
</>
Publications
</>
Jeoffray Vidalot
,
Cosimo Campanella
,
Julien Dachicourt
,
Claude Marcandella
,
Olivier Duhamel
,
Adriana Morana
,
David Poujols
,
Gilles Assaillit
,
Marc Gaillardin
,
Aziz Boukenter
,
Youcef Ouerdane
,
Sylvain Girard
,
Philippe Paillet
Monitoring of Ultra-High Dose Rate Pulsed X-ray Facilities with Radioluminescent Nitrogen-Doped Optical Fiber.
Sensors
22 (9) (2022)
Sylvain Girard
,
Adriana Morana
,
Cornelia Hoehr
,
Michael Trinczek
,
Jeoffray Vidalot
,
Philippe Paillet
,
Camille Bélanger-Champagne
,
Julien Mekki
,
Nicolas Balcon
,
Gaetano Li Vecchi
,
Cosimo Campanella
,
Damien Lambert
,
Emmanuel Marin
,
Aziz Boukenter
,
Youcef Ouerdane
,
Ewart Blackmore
Atmospheric Neutron Monitoring through Optical Fiber-Based Sensing.
Sensors
20 (16) (2020)
Adriana Morana
,
Cosimo Campanella
,
Jeoffray Vidalot
,
Vincenzo De Michele
,
Emmanuel Marin
,
Imène Reghioua
,
Aziz Boukenter
,
Youcef Ouerdane
,
Philippe Paillet
,
Sylvain Girard
Extreme Radiation Sensitivity of Ultra-Low Loss Pure-Silica-Core Optical Fibers at Low Dose Levels and Infrared Wavelengths.
Sensors
20 (24) (2020)
Alexandre Le Roch
,
Vincent Goiffon
,
Olivier Marcelot
,
Philippe Paillet
,
Federico Pace
,
Jean-Marc Belloir
,
Pierre Magnan
,
Cédric Virmontois
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage.
Sensors
19 (24) (2019)
Calvin Yi-Ping Chao
,
Shang-Fu Yeh
,
Meng-Hsu Wu
,
Kuo-Yu Chou
,
Honyih Tu
,
Chih-Lin Lee
,
Chin Yin
,
Philippe Paillet
,
Vincent Goiffon
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors
19 (24) (2019)
Mélanie Raine
,
Marc Gaillardin
,
Thierry Lagutere
,
Olivier Duhamel
,
Philippe Paillet
Estimating the Single-Event Upset sensitivity of a memory array using simulation.
Microelectron. Reliab.
78 (2017)