Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Calvin Yi-Ping ChaoShang-Fu YehMeng-Hsu WuKuo-Yu ChouHonyih TuChih-Lin LeeChin YinPhilippe PailletVincent GoiffonPublished in: Sensors (2019)