Tino Heijmen

Publication Activity (10 Years)

Years Active: 2005-2008
Publications (10 Years): 0

Publications

Tino Heijmen
Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? IOLTS (2008)
Tino Heijmen
Soft-Error Vulnerability of Sub-100-nm Flip-Flops. IOLTS (2008)
Tino Heijmen
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. IOLTS (2007)
Tino Heijmen, Damien Giot, Philippe Roche
Factors That Impact the Critical Charge of Memory Elements. IOLTS (2006)
Tino Heijmen
Soft Error Rates in Deep-Submicron CMOS Technologies. IOLTS (2006)
Tino Heijmen, André Nieuwland
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. ETS (2006)
Tino Heijmen
Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits. IOLTS (2005)