Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits.
Tino HeijmenPublished in: IOLTS (2005)
Keyphrases
- statistical model
- computational model
- high level
- vlsi circuits
- formal model
- sensitivity analysis
- experimental data
- mathematical model
- theoretical framework
- parameter estimation
- high speed
- probability distribution
- neural network
- theoretical analysis
- low cost
- least squares
- management system
- kalman filter
- video sequences
- empirical data
- estimation process
- data sets