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Soft Error Rates in Deep-Submicron CMOS Technologies.
Tino Heijmen
Published in:
IOLTS (2006)
Keyphrases
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image sequences
vlsi circuits
low power
high speed
low cost
power consumption
error rate
analog vlsi
emerging technologies
error detection
circuit design
delay insensitive
data mining
error bounds
web intelligence
estimation error
error analysis
relative error