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Soft-Error Rate Testing of Deep-Submicron Integrated Circuits.

Tino HeijmenAndré Nieuwland
Published in: ETS (2006)
Keyphrases
  • error rate
  • integrated circuit
  • electron beam
  • test set
  • vlsi circuits
  • lower error rates
  • feature selection
  • equal error rate
  • word error rate
  • learning algorithm
  • low cost
  • rule sets
  • training error