Teodor P. Gotszalk

Publication Activity (10 Years)

Years Active: 2002-2024
Publications (10 Years): 5

Top Topics

Quantitative Analysis

Position Tracking

Database Systems

Top Venues

IEEE Instrum. Meas. Mag.

IET Circuits Devices Syst.

Publications

René Laflamme, Piotr Putek, Tomasz Piasecki, Teodor P. Gotszalk
Digital Analysis of Damped Vibrations. IEEE Instrum. Meas. Mag. 27 (5) (2024)
Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor P. Gotszalk, Ivo Rangelow
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing. Sensors 19 (20) (2019)
Paolo Di Barba, Teodor P. Gotszalk, Wojciech Majstrzyk, Maria Evelina Mognaschi, Karolina Orlowska, Slawomir Wiak, Andrzej Sierakowski
Optimal Design of Electromagnetically Actuated MEMS Cantilevers. Sensors 18 (8) (2018)
F. Ivaldi, Tomasz Bieniek, Pawel Janus, Jerzy Zajac, Piotr Grabiec, Wojciech Majstrzyk, D. Kopiec, Teodor P. Gotszalk
New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout. ESSDERC (2016)
Stefan Goniszewski, John C. Gallop, Mohammad Adabi, Krzysztof Gajewski, Olena Shaforost, Norbert Klein, Andrzej Sierakowski, Jie Chen, Yifang Chen, Teodor P. Gotszalk, Ling Hao
Self-supporting graphene films and their applications. IET Circuits Devices Syst. 9 (6) (2015)
Grzegorz Józwiak, A. Henrykowski, A. Masalska, Teodor P. Gotszalk, I. Ritz, H. Steigmann
The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method CoRR (2011)
Artur Wiatrowski, W. M. Posadowski, Grzegorz Józwiak, Jaroslaw Serafinczuk, R. F. Szeloch, Teodor P. Gotszalk
Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD. Microelectron. Reliab. 51 (7) (2011)
Mauro Giacomini, Laura Pastorino, Federico Caneva Soumetz, J. A. Mielczarski, E. Mielczarski, Ivo Rangelow, Teodor P. Gotszalk
Data Modeling for Tools and Technologies for the Analysis and Synthesis of NANOstructures (TASNANO) Project. J. Inf. Technol. Res. 2 (3) (2009)
R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus
Scanning Thermal Microscopy in Microsystem Reliability Analysis. Microelectron. Reliab. 42 (9-11) (2002)