Scanning Thermal Microscopy in Microsystem Reliability Analysis.

R. F. Szeloch Teodor P. Gotszalk Pawel Janus

Published in: Microelectron. Reliab. (2002)

Keyphrases

reliability analysis
power plant
image analysis
infrared
high throughput
fault tree
microscopy images
structured light
decision support system
genetic programming
simulated annealing
high resolution
soft computing
feature selection
risk assessment
genetic algorithm
fluorescence microscopy
databases