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Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing.

Piotr KunickiTihomir AngelovTzvetan IvanovTeodor P. GotszalkIvo Rangelow
Published in: Sensors (2019)
Keyphrases
  • real time
  • significant improvement
  • sensitivity analysis
  • databases
  • search engine
  • database systems
  • preprocessing
  • data processing
  • information processing