Login / Signup
Tamao Ikeuchi
Publication Activity (10 Years)
Years Active: 2012-2013
Publications (10 Years): 0
Top Topics
Fault Tree
Design Process
Multiresolution
Autoregressive
Top Venues
Microelectron. Reliab.
</>
Publications
</>
Takuya Naoe
,
Tamao Ikeuchi
,
Chie Moritni
,
Hirohiko Endoh
,
Kohichi Yokoyama
Local damage free Si substrate ultra thinning for backside emission spectral analysis using OBPF for LSI failure mode detection.
Microelectron. Reliab.
53 (12) (2013)
Takuya Naoe
,
Hirotaka Komoda
,
Tamao Ikeuchi
,
Kohichi Yokoyama
Via high resistance failure analysis of LSI devices induced by multiple factors related to process and design.
Microelectron. Reliab.
52 (12) (2012)