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Via high resistance failure analysis of LSI devices induced by multiple factors related to process and design.
Takuya Naoe
Hirotaka Komoda
Tamao Ikeuchi
Kohichi Yokoyama
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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design process
case study
building blocks
database
data sets
user interface
evolutionary algorithm
real time
wide range
learning environment
computer aided
vector space model
design methodology
empirical data
design processes