Takafumi Taniguchi

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 1

Top Topics

Sensing Devices

Top Venues

Publications

Tsuyoshi Ueda, Shoichiro Nakao, Hiroshi Miyazaki, Takafumi Taniguchi, Hiromasa Takashima
Mass-Producible CuBr Thick Film Gas Sensors and its Highly Selective Ammonia Sensing Properties. ISOEN (2024)
H. Kouketsu, Shoko Kawasaki, Noriaki Koyama, Aki Takei, Takafumi Taniguchi, Yuichi Matsushima, Katsuyuki Utaka
High-speed and compact non-blocking 8×8 InAlGaAs/InAlAs Mach-Zehnder-type optical switch fabric. OFC (2014)
Kouji Nakahara, Yuki Wakayama, Takeshi Kitatani, Takafumi Taniguchi, Toshihiko Fukamachi, Yasushi Sakuma, Shigehisa Tanaka
56-Gb/s direct modulation in InGaAlAs BH-DFB lasers at 55°C. OFC (2014)
Takanori Suzuki, Hideo Arimoto, Takeshi Kitatani, Aki Takei, Takafumi Taniguchi, Kazunori Shinoda, Shigehisa Tanaka, Shinji Tsuji, Tatemi Ido, Jun Igrashi, Atsushi Nakamura, Kazuhiko Naoe, Kenji Uchida
Wide-Tuning-Wavelength-Range LGLC Laser with Low-Loss Dual-Core Spot Size Converter. IEICE Trans. Electron. (7) (2012)
Kazuhiro Mochizuki, Ken-ichi Tanaka, Takashi Shiota, Takafumi Taniguchi, Hiroyuki Uchiyama
Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated with B Ion Implantation. IEICE Trans. Electron. (7) (2006)
Hiroyuki Uchiyama, Takafumi Taniguchi, Takeshi Kikawa
Reduction of plasma-induced fluorine damage to P-HEMTs using x-ray emission. IEICE Electron. Express 2 (5) (2005)
Hiroyuki Uchiyama, Takafumi Taniguchi
Plasma-Induced Fluorine Damage in P-HEMT Caused by C2F6/CHF3 RIE Plasma. IEICE Electron. Express 1 (2) (2004)
Hiroyuki Uchiyama, Takafumi Taniguchi, Makoto Kudo
Suppression of plasma-induced fluorine damage in P-HEMTs using strained InSb barrier. IEICE Electron. Express 1 (16) (2004)
Hiroyuki Uchiyama, Hiroshi Sato, Kazunori Shinoda, Akira Taike, Takafumi Taniguchi, Shinji Tsuji
1.3-mu m InGaAlAs-BH laser with Cl2/N2 ECR plasma etched mesas. IEICE Electron. Express 1 (7) (2004)