Sung-Shick Kim

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Weighted Moving Average

Semiconductor Manufacturing

Interval Estimation

Process Control

Top Venues

BigData Congress

J. Intell. Manuf.

Publications

Seung Hwan Park, Cheong-Sool Park, Jun-Seok Kim, Sung-Shick Kim, Jun-Geol Baek, Daewoong An
Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process. BigData Congress (2013)
Bo Mi Lim, Jongwoo Kim, Sung-Shick Kim, Jun-Geol Baek
Point and Interval Estimation Method for Auto-regressive Model with Nonnormal Error. BigData Congress (2013)
Hyo-Heon Ko, Jihyun Kim, Sang-Hoon Park, Jun-Geol Baek, Sung-Shick Kim
Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average. J. Intell. Manuf. 23 (3) (2012)
Jonghyuck Park, Ick-Hyun Kwon, Sung-Shick Kim, Jun-Geol Baek
Spline regression based feature extraction for semiconductor process fault detection using support vector machine. Expert Syst. Appl. 38 (5) (2011)
Hyo-Heon Ko, Jun-Seok Kim, Jihyun Kim, Jun-Geol Baek, Sung-Shick Kim
Intelligent adaptive process control using dynamic deadband for semiconductor manufacturing. Expert Syst. Appl. 38 (6) (2011)
Hyo-Heon Ko, Jihyun Kim, Sung-Shick Kim, Jun-Geol Baek
Dispatching rule for non-identical parallel machines with sequence-dependent setups and quality restrictions. Comput. Ind. Eng. 59 (3) (2010)
Jihyun Kim, Sanghyeok Seo, Sung-Shick Kim
Neural Networks Fusion to Overlay Control System for Lithography Process. Australian Conference on Artificial Intelligence (2006)
Seungwoo Kwon, Kyungdo Park, Chulung Lee, Sung-Shick Kim, Hak-Jin Kim, Zhong Liang
Supply Chain Network Design and Transshipment Hub Location for Third Party Logistics Providers. ICCSA (3) (2006)
Hyun Joon Shin, Dong-Hwan Eom, Sung-Shick Kim
One-class support vector machines - an application in machine fault detection and classification. Comput. Ind. Eng. 48 (2) (2005)
Chang-Ouk Kim, Jin Jun, Sung-Shick Kim, Jong Kwan Baek
Contract-collaboration network method for modeling manufacturing resource control workflows. J. Intell. Manuf. 13 (6) (2002)