Sami A. Al-Arian

Publication Activity (10 Years)

Years Active: 1984-2000
Publications (10 Years): 0

Publications

Bassam Shaer, Sami A. Al-Arian, David L. Landis
Partitioning sequential circuits for pseudoexhaustive testing. IEEE Trans. Very Large Scale Integr. Syst. 8 (5) (2000)
Bassam Shaer, David L. Landis, Sami A. Al-Arian
Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 8 (6) (2000)
Bassam Shaer, Sami A. Al-Arian, David L. Landis
Pseudo-Exhaustive Testing of Sequential Circuits. Great Lakes Symposium on VLSI (1999)
Bassam Shaer, Sami A. Al-Arian, David L. Landis
Partitioning algorithm to enhance VLSI testability. ACM Southeast Regional Conference (1998)
Musaed A. Al-Kharji, Sami A. Al-Arian
A New Heuristic Algorithm for Estimating Signal and Detection Probabilities. Great Lakes Symposium on VLSI (1997)
Stephan P. Athan, David L. Landis, Sami A. Al-Arian
testing of deep submicron CMOS ICs. VTS (1996)
Randy E. Bolling, Sami A. Al-Arian
Reconfigurable Linear Feedback Register Design, Analysis & Applications. ISCAS (1994)
Sami A. Al-Arian, Randy E. Bolling
Improving the Testability of VLSI Circuits through Partitioning. ISCAS (1994)
Hussam Y. Abujbara, Sami A. Al-Arian
Degrading fault model for WSI interconnection lines. VTS (1993)
Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian
A Method for Consistent Fault Coverage Reporting. IEEE Des. Test Comput. 10 (3) (1993)
Sami A. Al-Arian, Musaed A. Al-Kharji
Fault Simulation and Test Generation by Fault Sampling Techniques. ICCD (1992)
Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel
A Unique Approach to Built-in-Self-Test Circuit Design. ICCD (1991)
Sami A. Al-Arian, Hari P. Kunamneni
Three approaches to design fault tolerant programmable logic arrays. ACM Southeast Regional Conference (1990)
Hussam Y. Abujbara, Sami A. Al-Arian
Self-testing and self-reconfiguration architecture for 2-D WSI arrays. SPDP (1990)
Sami A. Al-Arian
Design and Test in the Universities. ITC (1989)
Sami A. Al-Arian, Kevin A. Kwiat
Defining a Standard for Fault Simulator Evaluation. ITC (1988)
Dharma P. Agrawal, Sami A. Al-Arian
Comprehensive Fault Model and Testing of CMOS Circuits. ITC (1984)