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Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits.

Bassam ShaerDavid L. LandisSami A. Al-Arian
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2000)
Keyphrases
  • partitioning algorithm
  • vlsi circuits
  • mixed signal
  • low power
  • multi channel
  • graph partitioning
  • high speed
  • power consumption
  • digital circuits
  • low cost
  • unsupervised learning
  • graph model
  • vertical partitioning