Comprehensive Fault Model and Testing of CMOS Circuits.
Dharma P. AgrawalSami A. Al-ArianPublished in: ITC (1984)
Keyphrases
- fault model
- fault models
- delay insensitive
- high speed
- circuit design
- safety analysis
- analog vlsi
- fault injection
- vlsi circuits
- cmos technology
- model based diagnosis
- focal plane
- floating gate
- chip design
- power dissipation
- low cost
- power consumption
- random access memory
- low voltage
- asynchronous circuits
- advanced encryption standard