Q. Kan

Publication Activity (10 Years)

Years Active: 2004-2006
Publications (10 Years): 0

Publications

Yeong-Chang Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectron. Reliab. 46 (1) (2006)
Yeong-Chang Chou, D. Leung, Ioulia Smorchkova, Mike Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectron. Reliab. 44 (7) (2004)