A. Oki

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

Yeong-Chang Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectron. Reliab. 46 (1) (2006)