Login / Signup
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs.
Yeong-Chang Chou
D. Leung
R. Grundbacher
R. Lai
Q. Kan
P. H. Liu
D. Eng
T. Block
A. Oki
Published in:
Microelectron. Reliab. (2006)
Keyphrases
</>
field effect transistors
search space
artificial intelligence
image processing
data sets
genetic algorithm
face recognition
search algorithm
principal component analysis
low dimensional
space time
steady state
vector space
high density
space requirements
room temperature