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Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting.
Yeong-Chang Chou
D. Leung
Ioulia Smorchkova
Mike Wojtowicz
R. Grundbacher
L. Callejo
Q. Kan
R. Lai
P. H. Liu
D. Eng
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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