Priyadharshini Shanmugasundaram

Publication Activity (10 Years)

Years Active: 2011-2012
Publications (10 Years): 0

Top Topics

Statistical Tests

Top Venues

Publications

Priyadharshini Shanmugasundaram, Vishwani D. Agrawal
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock. VLSI Design (2012)
Priyadharshini Shanmugasundaram, Vishwani D. Agrawal
Dynamic scan clock control for test time reduction maintaining peak power limit. VTS (2011)
Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal
An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. VTS (2011)