Nelson Sepúlveda-Ramos

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 6

Top Topics

Dynamic Behavior

Microscope Images

Electrical Activity

Reliability Analysis

Top Venues

Publications

Harrison P. Lee, Delgermaa Nergui, Jeffrey W. Teng, Jackson P. Moody, Nelson Sepúlveda-Ramos, John D. Cressler
Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures. IRPS (2024)
Harrison P. Lee, Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Jackson P. Moody, Delgermaa Nergui, Brett L. Ringel, Zachary R. Brumbach, Alizeh Premani, Uppili S. Raghunathan, Vibhor Jain, John D. Cressler
The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. BCICTS (2023)
Harrison Lee, Arya Moradinia, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler
Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells. BCICTS (2022)
Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee, John D. Cressler
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. BCICTS (2022)
Harrison P. Lee, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler
Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs. BCICTS (2021)
Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, Harrison Lee, John D. Cressler
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. BCICTS (2020)