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Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers.

Nelson Sepúlveda-RamosJeffrey W. TengHarrison LeeJohn D. Cressler
Published in: BCICTS (2022)
Keyphrases
  • reliability analysis
  • thin film
  • data sets
  • neural network
  • grain size
  • electrical activity
  • real time
  • data mining
  • case study
  • multiscale
  • transmission line
  • power transmission