The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs.

Harrison P. Lee Nelson Sepúlveda-Ramos Jeffrey W. Teng Jackson P. Moody Delgermaa Nergui Brett L. Ringel Zachary R. Brumbach Alizeh Premani Uppili S. Raghunathan Vibhor Jain John D. Cressler

Published in: BCICTS (2023)

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