Monica Lobetti Bodoni

Publication Activity (10 Years)

Years Active: 1996-2003
Publications (10 Years): 0

Publications

Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41 (9) (2003)
Monica Lobetti Bodoni, Ben Bennetts
Guest Editors' Introduction: Board Test. IEEE Des. Test Comput. 20 (2) (2003)
Monica Lobetti Bodoni
Panel: "Board Test and ITC: What Does the Future Hold?". ITC (2002)
Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni
Online and Offline BIST in IP-Core Design. IEEE Des. Test Comput. 18 (5) (2001)
Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto
An effective distributed BIST architecture for RAMs. ETW (2000)
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni
A programmable BIST architecture for clusters of multiple-port SRAMs. ITC (2000)
Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs. ICCD (2000)
Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni
A Family of Self-Repair SRAM Cores. IOLTW (2000)
Stefano Barbagallo, Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Paolo Prinetto
Testing embedded memories in telecommunication systems. IEEE Commun. Mag. 37 (6) (1999)
Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto
An on-line BISTed SRAM IP core. ITC (1999)
Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
Scan insertion criteria for low design impact. VTS (1996)
Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto
A Parametric Design of a Built-in Self-Test FIFO Embedded Memory. DFT (1996)