Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures.
Alfredo BensoStefano Di CarloGiorgio Di NatalePaolo PrinettoMonica Lobetti BodoniPublished in: IEEE Commun. Mag. (2003)
Keyphrases
- embedded systems
- low cost
- clustering algorithm
- digital signal processors
- hardware and software
- general purpose
- hierarchical clustering
- flash memory
- real time embedded
- face recognition
- power consumption
- test cases
- document clustering
- real time
- fuzzy clustering
- data points
- single chip
- neural network
- data clustering
- subspace clustering
- cluster centers
- hw sw