Mark A. Kelly

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth
The importance of standardizing CDM ESD test head parameters to obtain data correlation. Microelectron. Reliab. 41 (11) (2001)
Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth
Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectron. Reliab. 41 (3) (2001)