The importance of standardizing CDM ESD test head parameters to obtain data correlation.
Leo G. HenryMark A. KellyTom DiepJon BarthPublished in: Microelectron. Reliab. (2001)
Keyphrases
- data sets
- original data
- image data
- training data
- data structure
- data analysis
- raw data
- test data
- data processing
- correlation analysis
- data collection
- database
- input data
- data points
- high quality
- knowledge discovery
- data sources
- complex data
- feature space
- physical parameters
- data mining techniques
- decision trees
- statistical significance
- input variables
- statistical methods
- prior knowledge
- data distribution
- experimental data
- sensor data
- missing data
- statistical analysis