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Leo G. Henry
Publication Activity (10 Years)
Years Active: 2001-2002
Publications (10 Years): 0
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Publications
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Leo G. Henry
,
Jon Barth
,
Hugh Hyatt
,
Tom Diep
,
Michael Stevens
Charged device model metrology: limitations and problems.
Microelectron. Reliab.
42 (6) (2002)
Leo G. Henry
,
Mark A. Kelly
,
Tom Diep
,
Jon Barth
The importance of standardizing CDM ESD test head parameters to obtain data correlation.
Microelectron. Reliab.
41 (11) (2001)
Leo G. Henry
,
Mark A. Kelly
,
Tom Diep
,
Jon Barth
Issues concerning charged device model ESD verification modules - the need to move to alumina.
Microelectron. Reliab.
41 (3) (2001)