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Issues concerning charged device model ESD verification modules - the need to move to alumina.
Leo G. Henry
Mark A. Kelly
Tom Diep
Jon Barth
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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computational model
probabilistic model
theoretical framework
mathematical model
experimental data
decision making
key issues
theoretical analysis
modular structure
real time
asynchronous circuits
bayesian framework
sensitivity analysis
cost function
prior knowledge
objective function
high level
data mining