Klaus-Jürgen Wolter

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 1

Top Topics

Microsoft Kinect

Transmission Rate

Noisy Measurements

Top Venues

Microelectron. Reliab.

Publications

Krzysztof Nieweglowski, Lukas Lorenz, Sebastian Lüngen, Tobias Tiedje, Klaus-Jürgen Wolter, Karlheinz Bock
Optical coupling with flexible polymer waveguides for chip-to-chip interconnects in electronic systems. Microelectron. Reliab. 84 (2018)
Tetiana Voitsekhivska, Felix Zorgiebel, Eike Suthau, Klaus-Jürgen Wolter, Karlheinz Bock, Gianaurelio Cuniberti
pH measurements of FET-based (bio)chemical sensors using portable measurement system. EMBC (2015)
Sabine Kirsten, Martin Schubert, Jurgen Uhlemann, Klaus-Jürgen Wolter
Characterization of ionic permeability and water vapor transmission rate of polymers used for implantable electronics. EMBC (2014)
Bjoern Boehme, Klaus-Jürgen Wolter
Study of temperature dependent properties of organic substrate materials. Microelectron. Reliab. 48 (6) (2008)
Steffen Wiese, Mike Roellig, Maik Mueller, Klaus-Jürgen Wolter
The effect of downscaling the dimensions of solder interconnects on their creep properties. Microelectron. Reliab. 48 (6) (2008)
Steffen Wiese, Klaus-Jürgen Wolter
Creep of thermally aged SnAgCu-solder joints. Microelectron. Reliab. 47 (2-3) (2007)
Mike Roellig, Rainer Dudek, Steffen Wiese, Bjoern Boehme, Bernhard Wunderle, Klaus-Jürgen Wolter, Bernd Michel
Fatigue analysis of miniaturized lead-free solder contacts based on a novel test concept. Microelectron. Reliab. 47 (2-3) (2007)
Steffen Wiese, Klaus-Jürgen Wolter
Microstructure and creep behaviour of eutectic SnAg and SnAgCu solders. Microelectron. Reliab. 44 (12) (2004)
Andrzej Dziedzic, Lars Rebenklau, Leszek J. Golonka, Klaus-Jürgen Wolter
Fodel microresistors-processing and basic electrical properties. Microelectron. Reliab. 43 (3) (2003)
Andrzej Dziedzic, Leszek J. Golonka, Jaroslaw Kita, Heiko Thust, Karl-Heinz Drue, Reinhard Bauer, Lars Rebenklau, Klaus-Jürgen Wolter
Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors. Microelectron. Reliab. 41 (5) (2001)