Ken Filliter

Publication Activity (10 Years)

Years Active: 2001-2002
Publications (10 Years): 0

Publications

Magnus Eckersand, Fredrik Franzon, Ken Filliter
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. J. Electron. Test. 18 (2) (2002)
Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh
A general purpose 1149.4 IC with HF analog test capabilities. ITC (2001)
Magnus Eckersand, Fredrik Franzon, Ken Filliter
Using at-speed BIST to test LVDS serializer/deserializer function. ETW (2001)