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Using At-Speed BIST to Test LVDS Serializer/Deserializer Function.

Magnus EckersandFredrik FranzonKen Filliter
Published in: J. Electron. Test. (2002)
Keyphrases
  • built in self test
  • high speed
  • test data
  • data sets
  • real world
  • artificial intelligence
  • information systems
  • data streams