Jong Chul Park

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 2

Top Topics

Embedded Systems

Reliability Analysis

Garbage Collection

Top Venues

Microelectron. Reliab.

Publications

Wontaeck Jung, Hyunggon Kim, Do-Bin Kim, Tae-Hyun Kim, Nam-Hee Lee, Dongjin Shin, Minyoung Kim, Youngsik Rho, Hun-Jong Lee, Yujin Hyun, Jaeyoung Park, Taekyung Kim, Hwiwon Kim, Gyeongwon Lee, Jisang Lee, Joonsuc Jang, Jungmin Park, Sion Kim, Su Chang Jeon, Suyong Kim, Jung-Ho Song, Min-Seok Kim, Taesung Lee, Byung-Kwan Chun, Tongsung Kim, Young Gyu Lee, Hokil Lee, Soowoong Lee, Hwaseok Lee, Dooho Cho, Sangwan Nam, Yeomyung Kim, Kunyong Yoon, Yoonjae Lee, Sunghoon Kim, Jungseok Hwang, Raehyun Song, Hyunsik Jang, Jae-Ick Son, Hongsoo Jeon, Myunghun Lee, Mookyung Lee, Kisung Kim, Eungsuk Lee, Myeong-Woo Lee, Sungkyu Jo, Chan Ho Kim, Jong Chul Park, Kyunghwa Yun, Soonock Seol, Ji-Ho Cho, Seungjae Lee, Jin-Yub Lee, Sunghoi Hur
13.3 A 280-Layer 1Tb 4b/cell 3D-NAND Flash Memory with a 28.5Gb/mm2 Areal Density and a 3.2GB/s High-Speed IO Rate. ISSCC (2024)
Se-Hoon Park, Jong Chul Park, Jae-Yong Park, Young-Ho Kim
Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. Microelectron. Reliab. 63 (2016)
Jong In Ryu, Se-Hoon Park, Dongsu Kim, Jun Chul Kim, Hyeongdong Kim, Jong Chul Park
A system-on-package module by embedding a mobile TV IC in printed-circuit-board. RWS (2012)
Dongsu Kim, Dong Ho Kim, Jong In Ryu, Chong-Dae Park, Jun Chul Kim, Jong Chul Park
A Highly Integrated Triple-Band RF Front-End Module for WiMAX Applications. IEICE Trans. Electron. (8) (2010)
Sung Chul Park, Eun Hyang Lo, Jong Chul Park, Young Chul Park
A korean search pattern in the like operation. ICEIS (1) (2007)