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Drop-shock reliability improvement of embedded chip resistor packages through via structure modification.
Se-Hoon Park
Jong Chul Park
Jae-Yong Park
Young-Ho Kim
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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low cost
structural information
neural network
embedded systems
social networks
significant improvement
data sets
decision trees
graph structure
circuit design
physical design
reliability analysis