Jingyu Pan

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 21

Top Topics

Security Concerns

Neural Architecture

Fully Automated

Feature Selection

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Jingyu Pan, Xuezhong Lin, Jinming Xu, Yiran Chen, Cheng Zhuo
Lithography Hotspot Detection Based on Heterogeneous Federated Learning With Local Adaptation and Feature Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (5) (2024)
Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Tunhou Zhang, Jiang Hu, Yiran Chen
Toward Fully Automated Machine Learning for Routability Estimator Development. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (3) (2024)
Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Jiang Hu, Yiran Chen
Rethink before Releasing Your Model: ML Model Extraction Attack in EDA. ASP-DAC (2023)
Qijun Zhang, Shiyu Li, Guanglei Zhou, Jingyu Pan, Chen-Chia Chang, Yiran Chen, Zhiyao Xie
PANDA: Architecture-Level Power Evaluation by Unifying Analytical and Machine Learning Solutions. CoRR (2023)
Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Yaguang Li, Yishuang Lin, Jiang Hu, Yiran Chen
Fully Automated Machine Learning Model Development for Analog Placement Quality Prediction. ASP-DAC (2023)
Qijun Zhang, Shiyu Li, Guanglei Zhou, Jingyu Pan, Chen-Chia Chang, Yiran Chen, Zhiyao Xie
PANDA: Architecture-Level Power Evaluation by Unifying Analytical and Machine Learning Solutions. ICCAD (2023)
Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Yiran Chen
EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research. CoRR (2023)
Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Jiang Hu, Yiran Chen
The Dark Side: Security and Reliability Concerns in Machine Learning for EDA. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (4) (2023)
Yabo Zhao, Ruiqing Zhao, Lanxin Chen, Jingyu Pan, Mei Zhang
Steady-state entanglement in a mechanically coupled double cavity containing magnetic spheres. Quantum Inf. Process. 21 (9) (2022)
Zhiyao Xie, Shiyu Li, Mingyuan Ma, Chen-Chia Chang, Jingyu Pan, Yiran Chen, Jiang Hu
DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters. ICCAD (2022)
Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Jiang Hu, Yiran Chen
Robustify ML-Based Lithography Hotspot Detectors. ICCAD (2022)
Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Ang Li, Minxue Tang, Tunhou Zhang, Jiang Hu, Yiran Chen
Towards Collaborative Intelligence: Routability Estimation based on Decentralized Private Data. CoRR (2022)
Xuezhong Lin, Jingyu Pan, Jinming Xu, Yiran Chen, Cheng Zhuo
Lithography Hotspot Detection via Heterogeneous Federated Learning with Local Adaptation. ASP-DAC (2022)
Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Yiran Chen
The Dark Side: Security Concerns in Machine Learning for EDA. CoRR (2022)
Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Ang Li, Minxue Tang, Tunhou Zhang, Jiang Hu, Yiran Chen
Towards collaborative intelligence: routability estimation based on decentralized private data. DAC (2022)
Zhiyao Xie, Rongjian Liang, Xiaoqing Xu, Jiang Hu, Chen-Chia Chang, Jingyu Pan, Yiran Chen
Preplacement Net Length and Timing Estimation by Customized Graph Neural Network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (11) (2022)
Xuezhong Lin, Jingyu Pan, Jinming Xu, Yiran Chen, Cheng Zhuo
Lithography Hotspot Detection via Heterogeneous Federated Learning with Local Adaptation. CoRR (2021)
Chen-Chia Chang, Jingyu Pan, Tunhou Zhang, Zhiyao Xie, Jiang Hu, Weiyi Qi, Chung-Wei Lin, Rongjian Liang, Joydeep Mitra, Elias Fallon, Yiran Chen
Automatic Routability Predictor Development Using Neural Architecture Search. ICCAD (2021)
Jingyu Pan, Chen-Chia Chang, Tunhou Zhang, Zhiyao Xie, Jiang Hu, Weiyi Qi, Chung-Wei Lin, Rongjian Liang, Joydeep Mitra, Elias Fallon, Yiran Chen
Automatic Routability Predictor Development Using Neural Architecture Search. CoRR (2020)
Jingyu Pan, Shivam Bhasin, Fan Zhang, Kui Ren
One Fault is All it Needs: Breaking Higher-Order Masking with Persistent Fault Analysis. IACR Cryptol. ePrint Arch. 2019 (2019)
Jingyu Pan, Fan Zhang, Kui Ren, Shivam Bhasin
One Fault is All it Needs: Breaking Higher-Order Masking with Persistent Fault Analysis. DATE (2019)