The Dark Side: Security and Reliability Concerns in Machine Learning for EDA.
Zhiyao XieJingyu PanChen-Chia ChangJiang HuYiran ChenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
- machine learning
- machine learning methods
- intrusion detection
- learning algorithm
- pattern recognition
- access control
- security policies
- security requirements
- feature selection
- information extraction
- information security
- computer vision
- reinforcement learning
- data mining
- security issues
- network security
- reliability analysis
- explanation based learning
- security analysis
- estimation of distribution algorithms
- artificial intelligence
- active learning
- machine learning algorithms
- rfid tags
- genetic algorithm
- security level
- security systems
- computer science
- computer security
- functional requirements
- data analysis
- evolutionary algorithm
- network management
- machine learning approaches
- supervised learning
- computational intelligence
- inductive learning
- text classification
- learning tasks
- model selection