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One Fault is All it Needs: Breaking Higher-Order Masking with Persistent Fault Analysis.
Jingyu Pan
Shivam Bhasin
Fan Zhang
Kui Ren
Published in:
IACR Cryptol. ePrint Arch. (2019)
Keyphrases
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higher order
fault detection
data analysis
fault diagnosis
real time
statistical analysis
information retrieval
website
multiscale
natural images
pairwise
real time embedded systems
fault tree
image analysis
expert systems
information systems
databases