Jeffrey C. Suhling

Publication Activity (10 Years)

Years Active: 1999-2018
Publications (10 Years): 2

Top Topics

Desirable Characteristics

Gate Dielectrics

Bayesian Networks

Top Venues

Microelectron. Reliab.

Publications

Richard C. Jaeger, Jeffrey C. Suhling
First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion. ESSDERC (2018)
Muhannad Mustafa, Jeffrey C. Suhling, Pradeep Lall
Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging. Microelectron. Reliab. 56 (2016)
Safina Hussain, Richard C. Jaeger, Jeffrey C. Suhling
Current dependence of the piezoresistive coefficients of CMOS FETs on (100) silicon. ESSDERC (2014)
Richard C. Jaeger, Jeffrey C. Suhling, Ramanathan Ramani, Arthur T. Bradley, Jianping Xu
CMOS stress sensors on [100] silicon. IEEE J. Solid State Circuits 35 (1) (2000)
Arthur T. Bradley, Richard C. Jaeger, Jeffrey C. Suhling, Y. Zou
Test chips for die stress characterization using arrays of CMOS sensors. CICC (1999)