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Jef Vanlaer
Publication Activity (10 Years)
Years Active: 2012-2014
Publications (10 Years): 0
Top Topics
Quality Prediction
Fault Diagnosis
Statistical Model
Measurement Noise
Top Venues
Comput. Chem. Eng.
ICDM
ECC
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Publications
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Geert Gins
,
Jef Vanlaer
,
Pieter Van den Kerkhof
,
Jan F. M. Van Impe
The RAYMOND simulation package - Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms.
Comput. Chem. Eng.
69 (2014)
Geert Gins
,
Jef Vanlaer
,
Pieter Van den Kerkhof
,
Jan F. M. Van Impe
Extending Statistical Models for Batch-End Quality Prediction to Batch Control.
ICDM
(2013)
Jef Vanlaer
,
Geert Gins
,
Jan F. M. Van Impe
Quality assessment of a variance estimator for Partial Least Squares prediction of batch-end quality.
Comput. Chem. Eng.
52 (2013)
Pieter Van den Kerkhof
,
Jef Vanlaer
,
Geert Gins
,
Jan F. M. Van Impe
Contribution plots for Statistical Process Control: Analysis of the smearing-out effect.
ECC
(2013)
Pieter Van den Kerkhof
,
Geert Gins
,
Jef Vanlaer
,
Jan F. M. Van Impe
Dynamic model-based fault diagnosis for (bio)chemical batch processes.
Comput. Chem. Eng.
40 (2012)
Jef Vanlaer
,
Pieter Van den Kerkhof
,
Geert Gins
,
Jan F. M. Van Impe
The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares.
ICDM
(2012)