Extending Statistical Models for Batch-End Quality Prediction to Batch Control.

Geert Gins Jef Vanlaer Pieter Van den Kerkhof Jan F. M. Van Impe

Published in: ICDM (2013)

Keyphrases

quality prediction
statistical models
image quality
statistical model
statistical modeling
feature selection
parameter estimation
machine learning
pairwise
control system
image data
language model
translation model
probability models
batch processing