The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares.
Jef VanlaerPieter Van den KerkhofGeert GinsJan F. M. Van ImpePublished in: ICDM (2012)
Keyphrases
- quality prediction
- partial least squares
- measurement noise
- image quality
- input data
- kalman filtering
- input variables
- discriminant analysis
- ls svm
- dimension reduction
- feature selection
- principal component regression
- factor analysis
- kalman filter
- principal component analysis
- high quality
- data sets
- sparse representation
- image classification
- least squares
- training set
- preprocessing
- reinforcement learning