Hyuntaek Jung

Publication Activity (10 Years)

Years Active: 2017-2023
Publications (10 Years): 7

Top Topics

Design Considerations

Top Venues

VLSI Technology and Circuits

Publications

Gyuseong Kang, Hyunjin Shin, Hyuntaek Jung, Sunkyu Lee, Jaeseung Choi, Sangyeop Baek, Hyunsung Jung, Daeshik Kim, Sohee Hwang, Shinhee Han, Yongsung Ji, Sei Seung Yoon
A 14nm 128Mb Embedded MRAM Macro achieved the Best Figure-Of-Merit with 80MHz Read operation and 18.1Mb/mm² implementation at 0.64V. VLSI Technology and Circuits (2023)
Longbin Jin, Yealim Oh, Hyunseo Kim, Hyuntaek Jung, Hyo Jin Jon, Jung Eun Shin, Eun Yi Kim
CONSEN: Complementary and Simultaneous Ensemble for Alzheimer's Disease Detection and MMSE Score Prediction. ICASSP (2023)
Taejoong Song, Jonghoon Jung, Woojin Rim, Hoonki Kim, Yongho Kim, Changnam Park, Jeongho Do, Sunghyun Park, Sungwee Cho, Hyuntaek Jung, Bongjae Kwon, Hyun-Su Choi, Jaeseung Choi, Jong Shik Yoon
A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications. ISSCC (2018)
Artur Antonyan, Suk-Soo Pyo, Hyuntaek Jung, Taejoong Song
Embedded MRAM Macro for eFlash Replacement. ISCAS (2018)
Taejoong Song, Woojin Rim, Sunghyun Park, Yongho Kim, Giyong Yang, Hoonki Kim, Sanghoon Baek, Jonghoon Jung, Bongjae Kwon, Sungwee Cho, Hyuntaek Jung, Yongjae Choo, Jaeseung Choi
A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization. IEEE J. Solid State Circuits 52 (1) (2017)
Artur Antonyan, Suk-Soo Pyo, Hyuntaek Jung, Gwanhyeob Koh, Taejoong Song
28-nm 1T-1MTJ 8Mb 64 I/O STT-MRAM with symmetric 3-section reference structure and cross-coupled sensing amplifier. ISCAS (2017)
Taejoong Song, Hoonki Kim, Woojin Rim, Yongho Kim, Sunghyun Park, Changnam Park, Minsun Hong, Giyong Yang, Jeongho Do, Jinyoung Lim, Seungyoung Lee, Ingyum Kim, Sanghoon Baek, Jonghoon Jung, Daewon Ha, Hyungsoon Jang, Taejung Lee, Chul-Hong Park, Bongjae Kwon, Hyuntaek Jung, Sungwee Cho, Yongjae Choo, Jaeseung Choi
12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis. ISSCC (2017)