Huixiang Huang

Publication Activity (10 Years)

Years Active: 2013-2023
Publications (10 Years): 8

Top Topics

Shot Boundary Detection

Medical Imaging

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Jienan Zhan, Daijiong Chen, Tingyi Xie, Huixiang Huang
Radiation Tolerant Silicon-on-Insulator MOSFETs Based on Special Neutron Irradiation Process. EITCE (2023)
Bohan Yuan, Zhipeng Wu, Dahui Jiang, Huixiang Huang
Design of SJ-IGBT Based on Carrier Storage Layer. EITCE (2023)
Daijiong Chen, Shuangfu Wang, Qifu Wei, Huixiang Huang
Novel Design of an Ultra Compact Software Defined Radio System with High-density Fan-out SiP Technology. EITCE (2023)
Tingyi Xie, Zidong Wang, Han Li, Peishu Wu, Huixiang Huang, Hongyi Zhang, Fuad E. Alsaadi, Nianyin Zeng
Progressive attention integration-based multi-scale efficient network for medical imaging analysis with application to COVID-19 diagnosis. Comput. Biol. Medicine 159 (2023)
Yu Li, Tiejun Li, Huixiang Huang
An Improved Dense Crowd Detection Algorithm Based on YOLOv5. EITCE (2022)
Tao He, Qi Han, Yu Li, Peng Yuan, Huixiang Huang
A Low Power Operational Amplifier Design Based on SOI DTMOS. EITCE (2022)
Huixiang Huang, Renjie Wu, Jingbiao Huang, Jucai Lin
DCCRGAN: Deep Complex Convolution Recurrent Generator Adversarial Network for Speech Enhancement. CoRR (2020)
Huixiang Huang, Yanyan Huang, Jiachun Zheng, Sufen Wei, Kai Tang, Dawei Bi, Zhengxuan Zhang
implantation. Microelectron. Reliab. 57 (2016)
Chao Peng, Zhiyuan Hu, Zhengxuan Zhang, Huixiang Huang, Bingxu Ning, Dawei Bi
Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation. Microelectron. Reliab. 54 (4) (2014)
Huixiang Huang, Dawei Bi, Zhengxuan Zhang
Investigation of the total dose response of partially depleted SOI nMOSFETs using TCAD simulation and experiment. Microelectron. J. 45 (6) (2014)
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou
Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. J. 44 (2) (2013)
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. Reliab. 53 (2) (2013)