Sign in
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.
Bingxu Ning
Dawei Bi
Huixiang Huang
Zhengxuan Zhang
Zhiyuan Hu
Ming Chen
Shichang Zou
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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x ray
infrared
trade off
image processing
dependence structure
database
real time
data sets
databases
information retrieval
artificial intelligence
decision trees
augmented naive bayes