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Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.

Bingxu NingDawei BiHuixiang HuangZhengxuan ZhangZhiyuan HuMing ChenShichang Zou
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • x ray
  • infrared
  • trade off
  • image processing
  • dependence structure
  • database
  • real time
  • data sets
  • databases
  • information retrieval
  • artificial intelligence
  • decision trees
  • augmented naive bayes