Gaëtan Math

Publication Activity (10 Years)

Years Active: 2009-2009
Publications (10 Years): 0

Publications

Christelle Bénard, Gaëtan Math, Pascal Fornara, Jean-Luc Ogier, Didier Goguenheim
Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities. Microelectron. Reliab. 49 (9-11) (2009)